Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Hwang, Seong-Don
Dowben, P. A.
Cheeseman, A.
Spencer, J. T.
and
Mcilroy, D. N.
1996.
Phosphorus Doping of Boron Carbon Alloys.
MRS Proceedings,
Vol. 452,
Issue. ,
Kumashiro, Y.
Yokoyama, T.
Sato, A.
and
Ando, Y.
1997.
Thermoelectric Properties of Boron and Boron Phosphide CVD Wafers.
Journal of Solid State Chemistry,
Vol. 133,
Issue. 1,
p.
314.
1998.
Non-Tetrahedrally Bonded Elements and Binary Compounds I.
Vol. 41C,
Issue. ,
p.
1.
Kumashiro, K.
Hirata, K.
Sato, K.
Yokoyama, T.
Aisu, T.
Ikeda, T.
and
Minaguchi, M.
2000.
Thermoelectric Properties of Boron and Boron Phosphide Films.
Journal of Solid State Chemistry,
Vol. 154,
Issue. 1,
p.
26.
2000.
Non-Tetrahedrally Bonded Binary Compounds II.
Vol. 41D,
Issue. ,
p.
1.
Kumashiro, Y.
Nakamura, K.
Sato, K.
Ohtsuka, M.
Ohishi, Y.
Nakano, M.
and
Doi, Y.
2004.
The properties of B–Sb thin films prepared by molecular flow region PVD process.
Journal of Solid State Chemistry,
Vol. 177,
Issue. 2,
p.
533.
Knezevic, Tihomir
Suligoj, Tomislav
and
Nanver, Lis K.
2019.
Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers.
p.
24.
Knezevic, Tihomir
Liu, Xingyu
Hardeveld, Erwin
Suligoj, Tomislav
and
Nanver, Lis K.
2019.
Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes.
IEEE Electron Device Letters,
Vol. 40,
Issue. 6,
p.
858.
Frye, C. D.
Shao, Q.
Murphy, J. W.
Harrison, S. E.
Voss, L. F.
Edgar, J. H.
and
Nikolic, R. J.
2021.
α Irradiation Response on the Electronic Transport Properties of p-B12P2.
Journal of Electronic Materials,
Vol. 50,
Issue. 1,
p.
75.
Xiaowen Fang, Piet
Nihtianov, Stoyan
Sberna, Paolo
and
Fang, Changming
2021.
Interfaces between crystalline Si and amorphous B: Interfacial interactions and charge barriers.
Physical Review B,
Vol. 103,
Issue. 7,
Knezevic, Tihomir
Suligoj, Tomislav
Capan, Ivana
and
Nanver, Lis K.
2021.
Low-Temperature Electrical Performance of PureB Photodiodes Revealing Al-Metallization-Related Degradation of Dark Currents.
IEEE Transactions on Electron Devices,
Vol. 68,
Issue. 6,
p.
2810.