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Small Angle Neutron Scattering from Nanocrystalline Pd and Cu Compacted at Elevated Temperatures

Published online by Cambridge University Press:  15 February 2011

P.G. Sanders
Affiliation:
Northwestern University, Materials Science and Engineering Department, Evanston, IL 60208
J.R. Weertman
Affiliation:
Northwestern University, Materials Science and Engineering Department, Evanston, IL 60208
J.G. Barker
Affiliation:
National Institute of Standards and Technology (NIST), Cold Neutron Research Facility, Gaithersburg, MD 20899
R.W. Siegel
Affiliation:
Argonne National Laboratory, Materials Science Division, Argonne, IL 60439

Abstract

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Nanocrystalline (n-) Cu and Pd, prepared by inert gas condensation (IGC) and in situ room temperature (RT) and elevated temperature (warm) compactions, have been studied by small angle neutron scattering (SANS). Previous work [1] on room temperature compacted and subsequently annealed n-Pd seemed to show that all the scattering could be accounted for by a distribution of pores. Analysis of more extensive SANS measurements, together with the results of prompt gamma activation analysis (PGAA), indicates that the SANS can be explained by the presence of pores and hydrogen. Warm compaction reduces the hydrogen impurity level, while increasing the bulk density and decreasing the pore size. This can lead to a dramatic hardness increase in these materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

References

REFERENCES

1. Sanders, P.G., Weertman, J.R., Barker, J.G., and Siegel, R.W., Scripta Metall. et Mat. 29, 91 (1993).Google Scholar
2. Nieman, G.W., Weertman, J.R., and Siegel, R.W., J. Mat. Res. 6, 1012 (1991).Google Scholar
3. Siegel, R.W., Ramasamy, S., Hahn, H., Li, Z., Lu, T., and Gronsky, R., J. Mat. Res. 2, 1367 (1988).Google Scholar
4. Warren, B.E., X-ray Diffraction (Addison-Wesley, Reading, 1969), pp. 251314.Google Scholar
5. Lindstrom, R.M., J. Res. NIST 98, 127 (1993).Google Scholar
6. Ehmann, W.D. and Ni, B.F., J. Radioanal. Nucl. Chem. 160, 169 (1992).Google Scholar
7. Hammouda, B., Krueger, S., and Glinka, C.J., J. Res. NIST 98, 31 (1993).Google Scholar
8. Tschope, A. and Birringer, R., Phil. Mag. B 68, 223 (1993)Google Scholar
9. Porod, G., in Small Angle X-ray Scattering, edited by Glatter, O. and Kratky, O., (Academic, London, 1982) pp. 1751.Google Scholar
10. Schaefer, H.-E., in Mechanical Properties and Deformation Behavior of Materials Having Ultra-Fine Microstructures, edited by Nastasi, M.A., Parkin, D.M., and Gleiter, H. (Proc. NATO Advanced Study Inst., Kluwer Academic, Dordrecht, 1993) pp. 81106.Google Scholar
11. Barker, J.G. and Weertman, J.R., Scripta Metall. et Mat. 24, 227 (1990).Google Scholar