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Role of Surface Steps in Thin Film Growth and Properties Studied by Leem
Published online by Cambridge University Press: 21 February 2011
Abstract
Atomic steps are a common defect at surfaces. Observations made with low energy electron microscopy are presented which demonstrate the impact of steps in growth, phase transitions, magnetic and orientational properties of thin films and clusters at surfaces. Most of these observations can be explained if steps modify the overlayer strain or interface energy.
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- Research Article
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- Copyright © Materials Research Society 1995
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