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Preparation and Characterization of Pb(Zr,Ti)O3 films prepared by a modified sol-gel route

Published online by Cambridge University Press:  18 May 2012

Dan Jiang ,
Chen Zhao ,
Shundong Bu  and
Jinrong Cheng
Dan Jiang
Affiliation:
School of Materials Science and Engineering, Shanghai University, Shanghai, 200072, China
Chen Zhao
Affiliation:
School of Materials Science and Engineering, Shanghai University, Shanghai, 200072, China
Shundong Bu
Affiliation:
School of Materials Science and Engineering, Shanghai University, Shanghai, 200072, China
Jinrong Cheng*
Affiliation:
School of Materials Science and Engineering, Shanghai University, Shanghai, 200072, China
*
*Email: [email protected]
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Abstract

Pb(Zr0.53Ti0.47)O3 (PZT) films have been fabricated on stainless steel substrates by a Polyvinylpirrolidone (PVP) modified sol-gel route. The single layer of about 0.26 μm was achieved by using the PVP-modified PZT sol, and Crack-free PZT films with thickness of up to 2.37 μm were fabricated by repeating the deposition process. The variations in crystallite orientation, microstructure, dielectric and ferroelectric properties of PZT films were investigated as a function of film thickness. Our results indicate that PZT films prepared on stainless steel substrates maintain good dielectric and ferroelectric properties.

Keywords

filmdielectric propertiesferroelectricity
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1449: Symposium BB – Solution Synthesis of Inorganic Films and Nanostructured Materials , 2012 , mrss12-1449-bb06-05
Copyright
Copyright © Materials Research Society 2012

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References

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