Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-09T07:58:52.759Z Has data issue: false hasContentIssue false
  • English
  • Français

Phase Transformations by Yttrium Implantation into Pure Aluminum

Published online by Cambridge University Press:  28 February 2011

X. G. Ning ,
C. Z. Ji  and
H. Q. Ye
X. G. Ning
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
C. Z. Ji
Affiliation:
Institute of Low Energy Physics, Beijing Normal University, Beijing 100875, China
H. Q. Ye
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
Get access

Abstract

Phase transformations by yttrium implantation into pure aluminum using 60kV ions and 3×1017 ions/cm2 dose have been studied by transmission electron microscopy (TEM). YAl3(12R) particles with an average size of 0.3μm were formed in the modified aluminum surface, which transformed into YFe3·5Alx (predominantly) and YAl3(8H) phase particles with 2 μm average diameter after being annealed at 600°C for one hour. The Fe ions were introduced by ion sputtering from the iron screws of the specimen holder, a previously unnoticed effect during heavy metal ion implantation for surface modification of materials. Electron diffraction experiments indicated that the YFe3·5Alx was a new phase and belongs to the orthorhombic system with a C-face-centered lattice (a=c=0.887nm, b=1.024nm). The reciprocal lattice of the YFe3·5Alx phase is related to that of the YFe4Al8 magnetic phase. The microstructure of the modified aluminum surface was also investigated by high-resolution TEM.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 235: Symposium A – Phase Formation and Modification by Beam-Solid Interactions , 1991 , 479
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFRENCE

[1] Brown, I.G., et al, Appli. Phys. Lett. 47(1985)385.Google Scholar
[2] Fayeulle, S. and Singer, I.L., Mater. Sci. Engng. A115 (1989)285.Google Scholar
[3] Follsteadt, D.M., et al, Nucl. Instrum. Methods B42 (1989) 205.CrossRefGoogle Scholar
[4] Lin, W.L., et al, Vacuum 26 (1986) 476.Google Scholar
[5] Gao, Y., et al, Chinese Phys. Lett. 8(1) (1991) 82.Google Scholar
[6] Bursill, L.A. and Braunshauser, G., Phil. Mag. A62 (1990) 295.Google Scholar