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New Insights Into Oxide Trapped Holes And Other Defects: Implications For Reliability Studies
Published online by Cambridge University Press: 15 February 2011
Abstract
New insights into the nature of oxide trapped holes and other defects have been gained from ionizing radiation studies. Specifically, connections have been established between hole traps and neutral traps. The nature of the defects, how they are related to each other, and their implications for reliability studies will be discussed.
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- Research Article
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- Copyright © Materials Research Society 1996
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