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A New Approach Towards Property Nanomeasurements Using In Situ TEM

Published online by Cambridge University Press:  10 February 2011

Z.L. Wang ,
P. Poncharal ,
W.A. De Heer  and
R.P. Gao
Z.L. Wang
Affiliation:
School of Materials Science and Engineering Atlanta GA 30332-0245
P. Poncharal
Affiliation:
School of Physics, Georgia Institute of Technology Atlanta GA 30332-0245
W.A. De Heer
Affiliation:
School of Physics, Georgia Institute of Technology Atlanta GA 30332-0245
R.P. Gao
Affiliation:
School of Materials Science and Engineering Atlanta GA 30332-0245
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Abstract

Property characterization of nanomaterials is challenged by the small size of the structure because of the difficulties in manipulation. Here we demonstrate a novel approach that allows a direct measurement of the mechancial and electrical properties of individual nanotube-like structures by in-situ transmission electron microscopy (TEM). The technique is powerful in a way that it can directly correlate the atomic-scale microstructure of the carbon nanotube with its physical properties, providing an one-to-one correspondence in structure-property characterization. Applications of the technique will be demonstrated on mechanical properties, the electron field emission and the ballistic quantum conductance in individual nanotubes. A nanobalance technique is demonstrated that can be applied to measure the mass of a single tiny particle as light as 22 fg (1 f= 10−15).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 217
Copyright
Copyright © Materials Research Society 2001

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References

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