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Microwave Imaging Techniques for Non-Destructive Testing of Materials
Published online by Cambridge University Press: 25 February 2011
Abstract
Recent technological advances for microwave multiport sensors lead us to look for efficient wavefront processing techniques in order to improve image quality, in terms of spatial resolution and contrast. This paper reviews some of these techniques which can be used for Non-Destructive Testing purposes. Mutual advantages and limitations are analysed.
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- Copyright © Materials Research Society 1992
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