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Microstructure and Properties of Mixed Yba2Cu3O7-X and Y2Ba4Cu8O16 Thin Films
Published online by Cambridge University Press: 28 February 2011
Abstract
Post-annealed thin films comprised of mixed YBa2Cu3O7-x (123) and Y2Ba4Cu8O16 (248) phases with both faulted and unfaulted microstructures have been characterized by planar and cross-section transmission electron microscopy. The influence of 248-type faults on the 123 structure, possible mechanisms for the higher Tc's of faulted films, and observations of a fourfold ordered structure are discussed.
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- Copyright © Materials Research Society 1990