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Metallic thin Films on Ceramic Substrates: Stress-Enhanced Intermixing and Spinel Formation

Published online by Cambridge University Press:  21 February 2011

P. Pirouz ,
Y. Ikuhara  and
C. P. Flynn
P. Pirouz
Affiliation:
Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, OH 44106–7204, U.S.A.
C. P. Flynn
Affiliation:
Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, U.S.A.
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Abstract

Multilayers of vanadium and MgO with different layer thicknesses were grown by molecular beam epitaxy (MBE) and the V/MgO and MgO/V interfaces were investigated by cross-sectional high resolution electron microscopy (HREM). For the smallest layer thickness of 5 nm, the vanadium and MgO films were coherent with each other and no misfit dislocations were observed. For the larger layer thicknesses of 10 nm and 50 nm, the vanadium surface exhibited undulations, and for the largest thickness, interdiffusion had occurred between the MgO film and the underlying V substrate and an interfacial spinel phase had formed. These observations are discussed in terms of the morphological instabilities of the strained vanadium film as it grows on the MgO substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 356: Symposium B2 – Thin Films: Stresses and Mechanical Properties V , 1994 , 247
Copyright
Copyright © Materials Research Society 1995

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