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Measurement of Strain Associated with Defects in SiTiO3 Bicrystals using Near-Field Scanning Optical Microscopy

Published online by Cambridge University Press:  15 February 2011

E. B. McDaniel  and
J. W. P. Hsu
E. B. McDaniel
Affiliation:
Dept. of Physics, Univ. of Virginia, Charlottesville, VA 22903
J. W. P. Hsu
Affiliation:
Dept. of Physics, Univ. of Virginia, Charlottesville, VA 22903
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Abstract

We incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 474: Symposium L – Epitaxial Oxide Thin Films III , 1997 , 131
Copyright
Copyright © Materials Research Society 1997

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References

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