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Interface and Volume Anisotropy of MBE-Grown Co/Pt (111), (110) and (001) and Sputtered CO/Pt Multilayers

Published online by Cambridge University Press:  03 September 2012

D. Weiler ,
R.F.C. Farrow ,
R.F. Marks ,
G.R. Harp ,
H. Notarys  and
G. Gorman
D. Weiler
Affiliation:
IBM Research Division, Almadén Research Center, San Jose CA 95120
R.F.C. Farrow
Affiliation:
IBM Research Division, Almadén Research Center, San Jose CA 95120
R.F. Marks
Affiliation:
IBM Research Division, Almadén Research Center, San Jose CA 95120
G.R. Harp
Affiliation:
IBM Research Division, Almadén Research Center, San Jose CA 95120
H. Notarys
Affiliation:
IBM Research Division, Almadén Research Center, San Jose CA 95120
G. Gorman
Affiliation:
IBM Research Division, Almadén Research Center, San Jose CA 95120
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Abstract

A quantitative determination of interface (Ks) and volume anisotropy {?ψ) constants of MBE and sputtered CO/Pt Multilayers is reported. Torque and VSM Magnetometry were used to determine the total average anisotropy and the room temperature magnetization of four different series of films with varying Co thickness and nearly constant Pt thickness. All films were characterized with X-ray diffraction and X-ray fluorescence, allowing the determination of the “Magnetic” volume with good accuracy. Both Ks and Jeff are found to be orientation dependent. We find the following results for MBE films grown on Ag buffered GaAs substrates and highly < 111 > textured films, grown on etched SiNx buffers:

(111) Ks = 0.97mJ/m2, Kveff =-0.74MJ/m3 MBE

(111) Ks = 0.92mJ/m2, Kveff =-l.lIMJ/m3 sputtered

(110) Ks = 0.42mJ/m2, Kveff =-l.95MJ/m3 MBE

(001) Ks = 0.59mJ/m2, Kveff =-5.98MJ/m3 MBE

The [110]-oriented MBE films show in addition a large (intrinsic) in-plane anisotropy constant K‖0≃-3MJ/m3 which is found to be independent of the Co thickness. [100] is the easy and [110] the hard in-plane direction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 313: Symposium Q1 – Magnetic Ultrathin Films, Multilayers and Surfaces/Magnetic Interfaces-Physics and Characterizations , 1993 , 791
Copyright
Copyright © Materials Research Society 1993

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References

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