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Imaging of the Carrier Density of States in Low Dimensional Structures Using Electrostatic Force Microscopy
Published online by Cambridge University Press: 10 February 2011
Abstract
In this work we show that scanning probe electrostatic force microscopy (EFM) can be applied to low dimensional electronic nanostructures for imaging the density of states of quantum confined carriers. The results on EFM studies are presented for quasione- dimensional (ID) Bi quantum wire arrays and quasi-two-dimensional (2D) GaAs/AlxGa1-x As multiple quantum well structures.
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- Copyright © Materials Research Society 1999