Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-25T17:34:34.413Z Has data issue: false hasContentIssue false

Hot Wall Epitaxial Growth of Diluted Magnetic Semiconductor Zn1-xMnxSe(111) GaAs(100) Substrate

Published online by Cambridge University Press:  21 February 2011

J. Wang
Affiliation:
Surface Physics Laboratory and Fudan T.D. Lee Physics Laboratory, Fudan University, hanghai, China
C.S. Zhu
Affiliation:
Surface Physics Laboratory and Fudan T.D. Lee Physics Laboratory, Fudan University, hanghai, China
Aziz-Ul-Haq Qureshi
Affiliation:
Surface Physics Laboratory and Fudan T.D. Lee Physics Laboratory, Fudan University, hanghai, China
Xun Wang
Affiliation:
Surface Physics Laboratory and Fudan T.D. Lee Physics Laboratory, Fudan University, hanghai, China
Get access

Abstract

We report the growth of Zn1-xMnxSe films on GaAs(100) by hot wall epitaxy (HWE) up to a Mn concentration of 52%. The crystal structures of Zn1-xMnxSe layers were characterized by x-ray diffraction and Raman scattering. For the first time Zn1-xMnxSe(111) layers on GaAs(100) substrate have been grown and mixed phases of zinc-blende and hexagonal structure have been observed over the range 0.19≤x≤0.52.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Furdyna, J.K., J.Appl.Phys. 64, R29 (1988).Google Scholar
2 Qadri, S.B., N.Samarth, and J.K.Furdyna, , J.Appl.Phys. 66,3622 (1989).Google Scholar
3 Kolodziejski, L.A., Gunshor, R.L., Bonsett, T.C., Venkatasubramanian, R., Datta, S., Bylsma, R.B., Becker, W.M. and Otsuka, N., Appl.Phys.Lett. 47, 69 1985).Google Scholar
4 Yoder-Short, D.R., Debska, U. and Furdyna, J.K., J.Appl.Phys. 58,4056 (1985).Google Scholar
5 Lopez-Otero, A., Thin Solid Films 49,3 (1978).,Google Scholar
6 Abramof, E., Pesek, A., Juza, P., Sitter, H., Fromherz, T. and Jantsch, W., Appl.Phys.Lett. 60,2368 (1992).Google Scholar
7 Jie, Wang, Aziz-Ul-Haq, Qureshi, Yu-Shi, Tian, Xun, Wang, Ying, Hu and Si-Ding, Zheng, J.Cryst.Growth 126,651 (1993).Google Scholar
8 Akira, Yamada, Nobuaki, Kojima, Kiyoshi, Takahashi, Tamotsu, Okamoto and Makoto, Konagai, Jpn.J.Appl.Phys. 31,L186 (1992).Google Scholar
9 Krost, A., Richter, W., Zahn, D.R.T., Hingrel, K. and Sitter, H., Appl.Phys.Lett. 57,1981 (1990).Google Scholar
10 Akhilesh, Arora, K., -K.Suh, E., Debska, U. and Ramdas, A.K., Phys.Rev.B 37,2927 (1988).Google Scholar
11 Fred, Pollak, H., Raphael, Tsu, SPIE Vol. 452 Spectroscopic Characterization Techniques for Semiconductor Technology (1983) P2628.Google Scholar
12 Wang, J., Yao, W.H., Wang, J.B., Lu, H.Q., Sun, H.H., and Wang, X., Appl.Phys.Lett.62,2845 (1993).Google Scholar