Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-05T09:12:59.958Z Has data issue: false hasContentIssue false
  • English
  • Français

High resolution studies of the solid state amorphization reaction in the ZrCo system with the atom probe/field ion microscope

Published online by Cambridge University Press:  15 February 2011

Susanne Schneider ,
Ralf Busch  and
Konrad Samwer
Susanne Schneider
Affiliation:
I. Physikalisches Institut, Universität Göttingen, Bunsenstr. 9, D- 37073 Göttingen, Germany
Ralf Busch
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-7, D-37073 Göttingen, Germany
Konrad Samwer
Affiliation:
Institut für Physik, Universität Augsburg, Memminger Str. 6, D- 86135 Augsburg, Germany
Get access

Abstract

The atom probe/field ion microscope is introduced as a new powerful investigation device to study the early stages of the solid state amorphization reaction (SSAR). A bilayer of Zr and Co was condensed under UHV conditions on W wire tips and analyzed in a field ion microscope (FIM) combined with an atom probe (AP). The reaction of Co with Zr has been studied at room temperature. FIM pictures and AP analysis have shown that even at low temperatures an amorphous phase is formed at the Zr/Co interface and in the Zr grain boundaries. In these areas concentration profiles have been taken on a nanometer scale. Most likely, the extended solid solution of Co found in α- Zr grain boundaries causes the formation of the amorphous phase. Further, Rutherford backscattering spectrometry (RBS) suggests that even point defects and dislocations at the surface of an α- Zr single crystal are sufficient to initiate the SSAR between a polycrystalline Co layer vapour- deposited onto that single crystal.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 343: Symposium H – Polycrystalline Thin Films - Structure, Texture, Properties and Applications , 1994 , 223
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Johnson, W.L., Mater. Sci. Eng. 97 (1988) 1.CrossRefGoogle Scholar
[2] Samwer, K., Phys. Rep., 161 (1988) 1.CrossRefGoogle Scholar
[3] Schröder, H. and Samwer, K., J. Mater. Res. 3 (1988) 461.CrossRefGoogle Scholar
[4] Barbour, J.C., Saris, F.W., Nastasi, M. and Meyer, J.W., Phys. Rev. B 32 (1985) 1363.CrossRefGoogle Scholar
[5] Schröder, H., Samwer, K. and Köster, U., Phys. Rev. Lett., 54, 19 (1985)CrossRefGoogle Scholar
[6] Busch, R., PhD thesis, Universität Gottingen (1992)Google Scholar
[7] Busch, R., Gärtner, F. and Schneider, S., this proceedingsGoogle Scholar
[8] Vieregge, K. and Herzig, Ch., Defect Diff. Forum 66–69 (1989) 811.Google Scholar
[9] Schneider, S., Busch, R., Boise, W. and Samwer, K., J. Non-Cryst. Solids 156–158 (1993) 498 CrossRefGoogle Scholar
[10] Ehrhart, P., Averback, R.S., Hahn, H., Yadavilli, S. and Flynn, CP., J. Mater. Res. 3 (1988) 1276.CrossRefGoogle Scholar