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Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films.

Published online by Cambridge University Press:  11 February 2011

A. Ramírez-Porras ,
L.F. Fonseca  and
O. Resto
A. Ramírez-Porras
Affiliation:
Centro de Investigación en Ciencia e Ingeniería de Materiales and Escuela de Física, Universidad de Costa Rica, San Pedro 2060, Costa Rica.
L.F. Fonseca
Affiliation:
Department of Physics, University of Puerto Rico, Río Piedras, PR 00931, U.S.A.
O. Resto
Affiliation:
Department of Physics, University of Puerto Rico, Río Piedras, PR 00931, U.S.A.
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Abstract

A stochastic distribution of nanocrystalline sizes model is applied to fit photoluminescence (PL) spectra of luminescent Si nanocrystals in a Si/SiO2 matrix synthesized by RF co-sputtering on the top of quartz substrates. With this method, the PL spectra from a diverse set of samples can be resolved mainly as the sum of two components: a contribution from a gaussian-like distribution of sizes of quantum dots (QD) and a similar component from a distribution of quantum wires (QW). These distributions of sizes and their associated PL energies agree well with the so-called Smart Quantum Confinement model (SQC).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 737 , 2002 , F3.30
Copyright
Copyright © Materials Research Society 2003

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References

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