Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-27T04:22:53.997Z Has data issue: false hasContentIssue false

Effects of Ga Compositional Grading on CIGS Electronic Properties Relevant to Solar Cell Performance

Published online by Cambridge University Press:  31 January 2011

JinWoo Lee
Affiliation:
[email protected], University of Oregon, Department of Physics, 1274 University of Oregon, Eugene, Oregon, 97403, United States, 1-541-255-6668
Jeroen K.J. van Duren
Affiliation:
[email protected], Nanosolar inc., Research, San Jose, California, United States
Alex Pudov
Affiliation:
[email protected], Nanosolar inc., Research, San Jose, California, United States
Miguel Contreras
Affiliation:
[email protected], NREL, Gordon, Colorado, United States
David J. Cohen
Affiliation:
[email protected], United States
Get access

Abstract

Transient photocurrent (TPI) and photocapacitance (TPC) spectroscopy have been applied to a set of compositional graded CuIn1-xGaxSe2 (CIGS) solar cell devices deposited by the vacuum co-evaporation method at the National Renewable Energy Laboratory. These measurements provide a spectral map of the optically induced release of carriers for photon energies from below 1 eV to 2 eV. By comparing the two types of spectra one can distinguish majority from minority carrier processes and they clearly reveal a higher degree of minority carrier collection for devices in which the Ga fraction increased monotonically with distance from the junction. This agrees with notions of how compositional grading improves overall cell performance. Minority carrier collection was even more strongly enhanced in sample devices incorporating v-shaped Ga-grading. Spatial profiles of the free hole carrier densities and deep acceptor concentrations were examined using drive-level capacitance profiling (DLCP). In the compositionally graded sample devices we found that the free carrier density decreased and that defect density increased with increasing Ga fraction toward back contact.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Franz, W. Z. Naturforschung 13a, 484 (1958).Google Scholar
2. Keldysh, L. V. Phys. (USSR) 33, 9941003 (1957), translation: Soviet Phys. JETP 6, 763 (1958).Google Scholar
3. Jiang, L. Wang, Q. and Schiff, E. A. Guha, S. and Yang, J. Deng, X., Appl. Phys. Lett. 69, 3063 (1996).Google Scholar
4. Henninger, R. Klaer, J. Siemer, K. Bruns, J. and Braunig, D. J. Appl. Phys. 89, 3049 (2001).Google Scholar
5. Heath, J. T. Cohen, J. D. and Shafarman, W. N. J. Appl. Phys. 95, 1000 (2004).Google Scholar
6. Lee, J. Heath, J. T. Cohen, J. D. and Shafarman, W. N. Mat. Res. Soc. Symp. Proc. 865, 373 (2005).Google Scholar
7. Zhu, K. Schiff, E. A. and Ganguly, G. Mat. Res. Soc. Symp. Proc. 715, 301 (2002).Google Scholar
8. Wang, Q. Crandall, R. S. and Schiff, E. A. in Conf. Rec. of the 21st Photovolt. Spec. Conf., 1113 (1996).Google Scholar
9. Heath, J. T. Cohen, J. D. Shafarman, W. N. Liao, D. X. and Rockett, A. A. Appl. Phys. Lett. 80, 4540 (2002).Google Scholar
10. Yan, Yanfa, Noufi, R. Jones, K. M. Ramanathan, K. Al-Jassim, M. M., and Stanbery, B. J. Appl. Phys. Lett. 87, 121904 (2005).Google Scholar
11. Werner, J. H. Mattheis, J. and Rau, U. Thin Solid Films 480-481, 399 (2005).Google Scholar
12. Lany, S. and Zunger, A. J. Appl. Phys. 100, 113725 (2006).Google Scholar