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Effects of Composition and Strain on Image Contrast in Atomic-Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

James M. Howe  and
Duane Sundo
James M. Howe
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie Mellon University, Pittsburgh, PA 15213
Duane Sundo
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie Mellon University, Pittsburgh, PA 15213
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Abstract

In this investigation, multislice image calculations were used to determine the effects of point defects on image contrast in ARTEM. It is shown that point defects with an atomic number different from the matrix produce a regular change in image contrast. The minimum detectable defect concentration for any system of matrix and solute can be predicted from a simple formula based on a rule of mixtures and the atomic numbers of the matrix and solute. The effects of lattice distortions associated with point defects appears to have minimal effect on image contrast in ARTEM. Optimum specimen and microscope conditions for observing point defects in crystals and the possibility of extending the analyses to interpret atomic-resolution images of larger defects are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 211
Copyright
Copyright © Materials Research Society 1989

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