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Direct Observation of Xrd Redox Processes in TMO'S

Published online by Cambridge University Press:  10 February 2011

H. Björk ,
T. Gustafsson  and
J.O. Thomas
H. Björk*
Affiliation:
Inorganic Chemistry, Ångström Laboratory, Uppsala University, Box 538, SE-751 21 Uppsala, SWEDEN
T. Gustafsson
Affiliation:
Inorganic Chemistry, Ångström Laboratory, Uppsala University, Box 538, SE-751 21 Uppsala, SWEDEN
J.O. Thomas
Affiliation:
Inorganic Chemistry, Ångström Laboratory, Uppsala University, Box 538, SE-751 21 Uppsala, SWEDEN
*
Corresponding author.: [email protected]; Tel.: +46 18 471 3717; Fax: +46 18 513548
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Abstract

Accurate XRD, often in combination with ND, has long been used to study electron density features in crystalline compounds. The method is particularly successful for light-atom systems in which the valence-to-core electron ratio is high. The same method is clearly applicable to the study of (typically) lithium insertion/extraction processes in TMO compounds; the greatest hinder has been the availability of sufficiently large single crystals, which do not then disintegrate into micron-size particles during the reaction. The case of V6O13 is especially advantageous in this context, however: millimeter-size crystals can be grown by CVT methods, which do not then exhibit severe cracking on lithium insertion, probably as a result of the layer-like nature of the structure. A sequence of single-crystal phases have now been studied in this way (LixV6O13 for x= 0, 1.0, 2.0 and 3.0) following in situ electrochemical synthesis in the composite cathode of a <Li| PE |V6O13> half-cell. The resulting structures have been solved, and their associated electron-density distributions carefully analysed by so-called Hirshfeld deformation electron density refinement. The method would appear to provide meaningful information relating to oxidation state changes occurring on lithium-ion insertion.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 548: Symposia EE – Solid State Ionics V , 1998 , 203
Copyright
Copyright © Materials Research Society 1999

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References

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