Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-30T21:20:14.512Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct observation of an ordered arrangement of vacancies and large local thermal vibration in rhenium silicide by Cs-corrected STEM

Published online by Cambridge University Press:  19 January 2011

Shunta Harada ,
Katsushi Tanaka ,
Kyosuke Kishida ,
Norihiko L Okamoto ,
Noriaki Endo ,
Eiji Okunishi  and
Haruyuki Inui
Shunta Harada
Affiliation:
Department of Materials Science and Engineering Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
Katsushi Tanaka
Affiliation:
Department of Materials Science and Engineering Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
Kyosuke Kishida
Affiliation:
Department of Materials Science and Engineering Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
Norihiko L Okamoto
Affiliation:
Department of Materials Science and Engineering Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
Noriaki Endo
Affiliation:
JEOL Ltd., Tokyo 196-8558, Japan
Eiji Okunishi
Affiliation:
JEOL Ltd., Tokyo 196-8558, Japan
Haruyuki Inui
Affiliation:
Department of Materials Science and Engineering Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan
Get access

Abstract

The crystal structure of thermoelectric rhenium silicide with an ordered arrangement of vacancies is investigated by utilizing spherical aberration (Cs) corrected scanning transmission electron microscopy (STEM) combined with synchrotron X-ray diffraction and conventional transmission electron microscopy. By STEM Cs corrected imaging, we can clearly observe Si vacancies in rhenium silicide, which is impossible without Cs correction. In addition, significantly reduced contrast levels are noted in STEM images for particular Si sites near vacancies. From the STEM image simulation, the reduced contrast levels are concluded to be due to anomalously large local thermal vibration of these Si atoms. The crystal structure of rhenium silicide can be successfully refined by the synchrotron X-ray diffraction starting with the deduced structure model from the STEM images and the occurrence of large local thermal vibration can be qualitatively confirmed. Furthermore, we confirm the validity of the refined crystal structure of rhenium silicide by comparing experimental images with simulated image generating with the refined crystal structure parameters.

Keywords

scanning transmission electron microscopy (STEM)crystallographic structurethermoelectric
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1295: Symposium N – Intermetallic-Based Alloys for Structural and Functional Applications , 2011 , mrsf10-1295-n07-11
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Vining, C. B., in CRC Handbook of Thermoelectrics, edited by Rowe, D.M. (CRC Press LLC, Boca Raston, 1995), p. 277.Google Scholar
2. Nishida, I., Phys. Rev. B 7, 2710 (1973).Google Scholar
3. Nishida, I., Mat. Sci. 7, 1119 (1972).Google Scholar
4. Ohsugi, I. J., Kojima, T. and Nishida, I.A., Phys. Rev. B 42, 10761 (1990).Google Scholar
5. Simkin, B. A., Ishida, A., Okamoto, N. L., Kishida, K., Tanaka, K. and Inui, H., Acta. Mater. 54, 2857 (2006).Google Scholar
6. Gu, J. J., Kuwabara, K., Tanaka, K., Inui, H., Yamaguchi, M., Yamamoto, A., Ohta, T. and Obara, H. in Defect Properties and Related Phenomena in Intermetallic Alloys (Mater. Res. Soc. Symp. Proc. 753, Pittsburgh, PA, 2003) pp501–506.Google Scholar
7. Neshpor, V. S. and Samsonov, G.V., Phys. Met. Metallogr. 11, 146 (1960).Google Scholar
8. Siegrist, T., Hulliger, F. and Travaglini, G., J. Less-Common Met. 92, 119 (1983).Google Scholar
9. Jorda, J. L., Ishikawa, M. and Muller, J., J. Less-Common Met. 85, 27 (1982).Google Scholar
10. Gottlieb, U., Lamgert-Andron, B., Nava, F., Affronte, M., Laborde, O., Roualt, A. and Mader, R., J. Appl. Phys. 78(6), 3902 (1995).Google Scholar
11. Kuwabara, K., Inui, H. and Yamaguchi, M., Intermetallics 10, 129 (2002).Google Scholar
12. Ishizuka, K., J. Electron Microsc. 50, 291 (2001).Google Scholar
13. Kilaas, R., Own, C., Deng, B., Tsuda, K., Sinkler, W., Marks, L., 2006 NCEMSS from EDM v2.0.1 http://www.numis.northwestern.edu/edm/.Google Scholar
14. Izumi, F. and Momma, K., Solid Stat. Phenom. 130, 15 (2007).Google Scholar
15. Liu, J. and Cowley, J. M., Ultramicroscopy 52, 335 (1993).Google Scholar
16. Watanabe, K., Kikuchi, Y., Yamazaki, T., Asano, E., Nakanishi, N., Okunishi, E. and Hashimoto, I., Acta. Cryst. A 60, 591 (2004).Google Scholar
17. Harada, S., Tanaka, K., Kishida, K., Okamoto, N. L., Inui, H., Okunishi, E. and Endo, N. in preparation.Google Scholar