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Determination of the Efficiency Enhancement Due to Scattering from Rough TCO Contact for a-Si:H P-I-N Solar Cells

Published online by Cambridge University Press:  26 February 2011

C. Walker ,
R. E. Hollingsworth  and
A. Madan
C. Walker
Affiliation:
Glasstech Solar, Inc. (GSI), 12441 W. 49th Avenue, Wheat Ridge, CO 80033, U.S.A.
R. E. Hollingsworth
Affiliation:
Glasstech Solar, Inc. (GSI), 12441 W. 49th Avenue, Wheat Ridge, CO 80033, U.S.A.
A. Madan
Affiliation:
Glasstech Solar, Inc. (GSI), 12441 W. 49th Avenue, Wheat Ridge, CO 80033, U.S.A.
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Abstract

A-Si:H p-i-n solar cells were deposited on textured transparent conducting oxide coated glass substrates to experimentally determine the enhancement in the short circuit current density. It was found that the optical thickness can be increased by a factor from 3 to 5. These results agree reasonably well with the predictions of optical enhancement theory.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 95: Symposium E – Amorphous Silicon Semiconductors--Pure and Hydrogenated , 1987 , 527
Copyright
Copyright © Materials Research Society 1987

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References

1 Xi, J., Hollingsworth, R.E., Bhat, P.K., and Madan, A., Proc. of Int. Conf. on Stability of a-Si alloy Mat. and Dev., Palo Alto, Calif., January, 1987.Google Scholar
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4 Mizuhashi, M., Proc. MITI/NEDO-EPRI Conf. Osaka, Japan, November 1986.Google Scholar