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Density Changes in Amorphous Pd80Si20 During Low Temperature ion Irradiation
Published online by Cambridge University Press: 16 February 2011
Abstract
Density changes in amorphous Pd80Si20 during ion irradiation below 100K were detected by in situ HVEM measurements of the changes in specimen length as a function of ion fluence. A decrease in mass density as a function of the ion fluence was observed. The saturation value of the change in mass density was determined to be approximately -1.2 %.
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- Copyright © Materials Research Society 1995
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