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Cross-Sectional TEM Studies of DIGM in Irradiated Au-Cu Bilayers
Published online by Cambridge University Press: 25 February 2011
Abstract
Cross-sectional transmission electron microscopy was used to study diffusion-induced grain boundary migration (DIGM) in irradiated and annealed Au/Cu bilayers. Using this technique, in combination with small probe X-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample.
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- Copyright © Materials Research Society 1993