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Convergent-Beam Diffraction in the Characterization of Crystalline Phases

Published online by Cambridge University Press:  25 February 2011

J. A. Eades ,
M. J. Kaufman  and
H. L. Fraser
J. A. Eades
Affiliation:
University of Illinois, 104 S. Goodwin, Urbana, IL 61801
M. J. Kaufman
Affiliation:
University of Illinois, 104 S. Goodwin, Urbana, IL 61801
H. L. Fraser
Affiliation:
University of Illinois, 104 S. Goodwin, Urbana, IL 61801
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Abstract

Convergent-beam diffraction in the transmission electron microscope is a powerful technique for the characterization of crystalline materials. Examples are presented to show the way in which convergent-beam zone-axis patterns can be used to determine: the unit cell; the symmetry; the strain of a crystal. The patterns are also recognizable and so can be used, like fingerprints, to identify phases.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 62: Symposium Q – Materials Problem Solving with the Transmission Electron Microscope , 1985 , 143
Copyright
Copyright © Materials Research Society 1986

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References

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