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Convergent-Beam Diffraction in the Characterization of Crystalline Phases
Published online by Cambridge University Press: 25 February 2011
Abstract
Convergent-beam diffraction in the transmission electron microscope is a powerful technique for the characterization of crystalline materials. Examples are presented to show the way in which convergent-beam zone-axis patterns can be used to determine: the unit cell; the symmetry; the strain of a crystal. The patterns are also recognizable and so can be used, like fingerprints, to identify phases.
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- Copyright © Materials Research Society 1986
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