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Atomic Force Microscope Designs and Applications

Published online by Cambridge University Press:  21 February 2011

P. J. Bryant ,
R. G. Miller ,
R. H. Deeken  and
M. A. Pederson
P. J. Bryant
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
R. G. Miller
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
R. H. Deeken
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
M. A. Pederson
Affiliation:
Univ. of Missouri-Kansas City, Physics Department; 1110 E. 48th St.; Kansas City, MO 64110
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Abstract

Atomic force microscopes (AFM) have been designed and tested. A simple reliable version with high resolving power is described here. Materials of construction and operational parameters are reported. Applications to a range of materials has confirmed the general usefulness of AFM technology to materials research.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 235
Copyright
Copyright © Materials Research Society 1989

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References

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