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The Analysis of Depth-Sensing Indentation Data: Review of the Special Discussion Session

Published online by Cambridge University Press:  15 February 2011

Shefford P. Baker  and
T.P. Weihs
Shefford P. Baker
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestrasse 92, 7000 Stuttgart 1, Germany
T.P. Weihs
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
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Extract

In light of recent advances in the analysis of depth-sensing indentation data and of the importance of this technique in the study of the mechanical properties of thin films, a special discussion session was held in order to explore the state of the art and to provide an informal forum for discussion. This is a brief review of that discussion. The discussion was focused by the four main sources of deviation from model behavior described in the previous paper.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 308: Symposium M1 – Thin Films: Stresses and Mechanical Properties IV , 1993 , 217
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

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