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Successes and Predictions of A Pseudopotential Approach in Anion-Mixed Nitrides

Published online by Cambridge University Press:  21 March 2011

L. Bellaiche ,
A. Al-Yacoub ,
N. A. Modine  and
E. D. Jones
L. Bellaiche
Affiliation:
Physics Department, University of Arkansas, Fayetteville, Arkansas 72701, USA
A. Al-Yacoub
Affiliation:
Physics Department, University of Arkansas, Fayetteville, Arkansas 72701, USA
N. A. Modine
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
E. D. Jones
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
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Abstract

The construction and the parameters of a new-strain dependent empirical pseudopotentials method are described and provided, respectively. This method is shown to reproduce with a very high accuracy some observed unusual properties in various complex anion-mixed nitride alloys. This method is also used to predict and understand anomalous effects that remain to be experimentally discovered in Ga1−yInyAs1−xNx quaternaries and GaAs0.5−xP0.5−xN2x solid solutions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 692: Symposium H – Progress in Semiconductor Materials for Optoelectronic Applications , 2001 , H1.3.1
Copyright
Copyright © Materials Research Society 2002

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References

1. Weyers, M., Sato, M. and Ando, H., Jpn. J. Appl. Phys. 31, L853 (1992).Google Scholar
2. Kondow, M. et al, Jpn. J. Appl. Phys. 33, L1056 (1994).Google Scholar
3. Bellaiche, L., Wei, S-H. and Zunger, A., Phys. Rev. B 54, 17568 (1996).Google Scholar
4. Bi, W.G. and Tu, C.W., Appl. Phys. Lett. 70, 1608 (1997).Google Scholar
5. Uesugi, K., Morooka, N. and Suemune, I., Appl. Phys. Lett. 74, 1254 (1999).Google Scholar
6. Shan, W., Walukiewicz, W., Ager, J.W. III, Haller, E. E., Geisz, J.F., Friedman, D.J., Olson, J.M. and Kurtz, S.R., Phys. Rev. Lett. 82, 1221 (1999).Google Scholar
7. Jones, E.D., Modine, N.A., Allerman, A.A., Kurtz, S.R., Wright, A.F., Tozer, S.T. and Wei, X., Phys. Rev. B. 60, 4430 (1999).Google Scholar
8. Jones, E.D., Allerman, A.A., Kurtz, S.R., Modine, N.A., Bajaj, K.K., Tozer, S.T. and Wei, X., Phys. Rev. B. 62, 7144 (2000); E.D. Jones et al, Proc SPIE 3621, 52 (1999); E.D. Jones et al, Proc SPIE 3944, 80 (2000).Google Scholar
9. Mattila, T., Wei, S.H.- and Zunger, A. Phys. Rev. B. 60, R11245 (1999).Google Scholar
10. Bellaiche, L., Appl. Phys. Lett. 75, 2578 (1999).Google Scholar
11. Bellaiche, L., Wei, S-H. and Zunger, A., Phys. Rev. B 56, 10233 (1997).Google Scholar
12. Zhang, Y., Mascarenhas, A., Xin, H.P. and Tu, C.W., Phys. Rev. B 61, 7479 (2000).Google Scholar
13. Bellaiche, L. and Zunger, A., Phys. Rev. B 57, 4425 (1998).Google Scholar
14. Al-Yacoub, and Bellaiche, L., Phys. Rev. B 62, 10847 (2000).Google Scholar
15. Kim, K. and Zunger, A., Phys. Rev. Lett. 86, 2609 (2001).Google Scholar
16. Nelson, R.J., in Excitons, edited by Rashba, E.I. and Sturge, M.D., North-Holland Publishing company (1982).Google Scholar
17. Bellaiche, L., Modine, N.A. and Jones, E.D., Phys. Rev. B 62, 15311 (2000).Google Scholar
18. Kent, P.R.C. and Zunger, A., Phys. Rev. B 64, 115208 (2001); Phys. Rev. Lett. 86, 2613 (1996).Google Scholar
19. Wei, S.-H. and Zunger, A., Phys. Rev. Lett. 76, 664 (1996).Google Scholar
20. Zhang, Y., Mascarenhas, A., Xin, H.P. and Tu, C.W., Phys. Rev. B 63, 161303 (2001).Google Scholar
21. Wang, L.-W., Appl. Phys. Lett. 78, 1565 (2001).Google Scholar
22. Van Vechten, J.A., Phys. Rev. 182, 891 (1969).Google Scholar
23. Bellaiche, L., Wei, S-H. and Zunger, A., Appl. Phys. Lett. 70, 3558 (1997).Google Scholar
24. Keating, P.N., Phys. Rev. 145, 637 (1966).Google Scholar
25. Martin, R.M., Phys. Rev. B 1, 4005 (1970).Google Scholar
26. Kim, K., Lambrecht, W.R.L. and Segall, B., Phys. Rev. B 53, 16310 (1996).Google Scholar
27. Wei, S.-H. and Zunger, A., Phys. Rev. B 60, 5404 (1999).Google Scholar
28. Bi, W.G. and Tu, C.W., J. Appl. Phys. 80, 1934 (1996).Google Scholar
29. Wetzel, C., Takeuchi, T., Yamaguchi, S., Katoh, H., Amano, H. and Akasaki, I., Appl. Phys. Lett. 73, 1994 (1998).Google Scholar
30. Cluskey, M.D., Van de Walle, C.G., Master, C.P., Romano, L.T., and Johnson, N.M., Appl. Phys. Lett. 72, 2725 (1998).Google Scholar
31. Pankove, J.I. and Hutchby, J.A., J. Appl. Phys. 47, 5387 (1976).Google Scholar
32. Wang, L.W. and Zunger, A., J. Chem. Phys. 100, 2394 (1994).Google Scholar
33. Gokhale, M.R., Wei, J., Wang, H. and Forrest, S.R., Appl. Phys. Lett. 74, 1287 (1999).Google Scholar
34. Uesugi, K., Suemune, I., Hasegawa, T., Akutagawa, T. and Nakamura, T., Appl. Phys. Lett. 76, 1285 (2000).Google Scholar
35. Malikova, L., Pollack, F.H. and Bhat, R., J. Electron. Mater 27, 484 (1998).Google Scholar
36. Gilet, P., Grenouillet, L., Duvaut, P., Ballet, P., Rolland, G., Vannuffel, C. and Million, A., J. Vac. Sci. Technol. B. 19, 1422 (2001).Google Scholar
37. Hjalmarson, H.P., Vogl, P., Wolford, D.J. and Dow, J.D., Phys. Rev. Lett. 44, 810 (1980).Google Scholar
38. Perkins, J.D., Mascarenhas, A., Zhang, Y., Geisz, J.F., Friedman, D.J., Olson, J.M. and Kurtz, S.R., Phys. Rev. Lett. 82, 3312 (1999).Google Scholar