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The Study about the Control of Defect Factors to Improve Properties of P(VDF-TeFE) Thin Film

Published online by Cambridge University Press:  17 June 2011

Jong-Hyeon Jeong
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
Daiki Terashima
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
Chiharu Kimura
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
Hidemitsu Aoki
Affiliation:
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
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Abstract

In order to apply P(VDF-TeFE) piezoelectric polymer to micro-generator as a membrane, the polymer is deposited on a substrate by spin-coating method. Since a solvent affects the film properties and surface stability, we have carried out the thermal process at a temperature higher than melting point. In the annealing process of a P(VDF-TeFE) thin film, electrical properties of the film was improved by an application of an electric field. The established study was the investigation of variations in characteristics by an application of a certain electric field. We have attempted to measure about the critical intensity of an electric field and investigate what the influences of the application is caused using a XPS spectrum in this study. Moreover, in order to control the intrusion of impurities, we have used the vacuum chamber to carry out the annealing process in it.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

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