Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-19T08:36:59.509Z Has data issue: false hasContentIssue false
  • English
  • Français

Progress in Cdl-xZnxTe (CZT) Radiation Detectors

Published online by Cambridge University Press:  21 February 2011

J. F. Butler ,
F. P. Doty ,
B. Apotovsky ,
S. J. Friesenhahn  and
C. Lingren
J. F. Butler
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
F. P. Doty
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
B. Apotovsky
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
S. J. Friesenhahn
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
C. Lingren
Affiliation:
Aurora Technologies Corporation 7408 Trade Street San Diego, CA 92121
Get access

Abstract

Results of a program to improve the performance of Cd1-xZnxTe detectors by adjusting growth parameters to achieve low-strain, high purity low defect crystals, investigating surface effect phenomena and contacting methods, and establishing reproducible manufacturing methods are reviewed and discussed. Processing and fabrication methods were developed which are applicable throughout the composition range. Energy spectra for room temperature Cdl-xZnxTe detectors exhibit resolutions (FWHM) from 2.16 keV at 14 keV to 6.9 keV at 122 keV. An energy resolution of 910 eV at 5.9 keV was achieved at −25 C. Stable ohmic contacts and gamma ray detection for ZnTe are reported for the first time. Applications of Cdl-xZnxTe to nuclear medicine and X-ray fluorescence are discussed. New gamma ray imagers using Cd1-xZnxTe detector arrays are described, and imaging data for a 32 × 32 monolithic array of 1 mm2 elements on a 42mm × 42mm substrate are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 302: Symposium F – Semiconductors for Room-Temperature Radiation Detector Applications , 1993 , 497
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Raiskin, E. and Butler, J.F., IEEE Trans. Nucl. Science, 35, 82 (1988).CrossRefGoogle Scholar
2. Doty, F. P., Butler, J. F., Bower, K. and Schetzina, J., J. Vac. Sci. and Technology B.10, 1418 (1992).Google Scholar
3. Butler, J. F., Doty, F. P. and Lingren, C. L., “CdZnTe Gamma Ray Detectors”, IEEE Transactions on Nuclear Science 39, 605 (1992).Google Scholar
4. Butler, J.F., Doty, F.P., Apotovsky, B., Lajcerowicz, J. and Verger, L., Materials Science & Engineering, B16, 291 (1993).CrossRefGoogle Scholar
5. Butler, J. F., Doty, F.P. and Apotovsky, B., to be published in Proc., SPIE International Symposium, 19-24 July, 1992, San Diego.Google Scholar
6. Butler, J. F., Doty, F.P. and Lingren, C., Second Topical Meeting on Industrial Radiation and Radioisotope Measurement and Applications, Raleigh, September 8-11, 1993.Google Scholar
7. e.g., Malm, H.L. and Martini, M., IEEE Trans. Nucl. Science 21, 322 (1974).Google Scholar
8. Butler, J.F., Friesenhahn, S.J., Lingren, C., Apotovsky, B., Doty, F.P, Ashburn, W.L. and Dillon, W., SPIE Medical Imaging 1993, 14-19 February, 1993, Newport Beach, California.Google Scholar
9. Doty, F.P, Friesenhahn, S.J., J.F. Butler and Hink, P.L., Aerospace Science and Sensing, SPIE, Orlando, April 12-16, 1993.Google Scholar