Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-20T06:45:36.926Z Has data issue: false hasContentIssue false

Profiling of Hydrogen in Zirconium Surfaces by Laser Ablation with Resonance Ionization

Published online by Cambridge University Press:  01 January 1992

G.A. Bickel
Affiliation:
AECL Research, Chalk River, Ontario, Canada KOJ IJO
G.A. Mcrae
Affiliation:
AECL Research, Chalk River, Ontario, Canada KOJ IJO
L.W. Green
Affiliation:
AECL Research, Chalk River, Ontario, Canada KOJ IJO
Get access

Abstract

Elemental distributions in the bulk and metal oxide surface layers of zirconium alloys play key roles in the fracture toughness of the alloys. In particular, localized hydrogen build-up leads to hydride formation and delayed hydride cracking. Parts per million levels of H in Zr have been detected using the 1.06 μm or 355 nm output of a Nd:YAG laser for ablation followed by 2+1 resonance ionization detection of H and D. Analysis of the ablation plume has shown that it consists predominately of atomic species in thermal equilibrium between 2000 and 3600°C. Ablation of thin foils has shown that the ablation rate is on the order of mono-layers per shot and increases exponentially with increasing fluence. Laser ablation depth profiling results of H distributions in an anodically grown oxide film compare qualitatively with nuclear-reaction-analysis profiling of the same sample.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Proc. 5th Int. Symp. on Resonance Ionization Spectroscopy and its Applications, edited by Parks, J.E. and Omenetto, N., Institute of Physics Conf. 114 (1990).Google Scholar
2. Estler, R.C. and Nogar, N.S., J. Appl. Phys. 69, 1654 (1991).Google Scholar
3. Kelly, R., J. Chem. Phys. 92, 5047 (1990).Google Scholar
4. Sibold, D. and Urbassek, H.M., Appl. Phys. B55, 391 (1992).Google Scholar
5. Stern, A., Khatamian, D., Laursen, T., Weatherly, G.C. and Perz, J.M., J. Nucl. Mater. 144, 35 (1987).Google Scholar