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Photothermal Investigation of Surfaces and Interfaces in Amorphous Silicon Films

Published online by Cambridge University Press:  25 February 2011

G. Amato ,
L. Boarino ,
Giuliana Benedetto  and
R Spagnolo
G. Amato
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
L. Boarino
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
Giuliana Benedetto
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
R Spagnolo
Affiliation:
Istituto Elettrotecnico Nazionale Galileo Ferraris, Strada delle Cacce 91, 10135 Torino, Italy
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Abstract

A method for the determination of surface and interface states is suggested, based on the observation of interference fringe pattern in photo-thermal spectra. Some experimental results are presented and interpreted by means of a theoretical approach. The method allows in most cases to get an evaluation of surface and interface density of states.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 192: Symposium O – Amorphous Silicon Technology - 1990 , 1990 , 207
Copyright
Copyright © Materials Research Society 1990

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References

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