Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-27T02:04:50.266Z Has data issue: false hasContentIssue false

Low Dielectric Constant Polymers For On-Chip Interlevel Dielectrics With Copper Metallization

Published online by Cambridge University Press:  15 February 2011

Ronald J. Gutmann
Affiliation:
Center for Integrated Electronics and Electronics Manufacturing, Rensselaer Polytechnic Institute, Troy, NY 12180
T. Paul Chow
Affiliation:
Center for Integrated Electronics and Electronics Manufacturing, Rensselaer Polytechnic Institute, Troy, NY 12180
David J. Duquette
Affiliation:
Center for Integrated Electronics and Electronics Manufacturing, Rensselaer Polytechnic Institute, Troy, NY 12180
Toh-Ming Lu
Affiliation:
Center for Integrated Electronics and Electronics Manufacturing, Rensselaer Polytechnic Institute, Troy, NY 12180
John F. Mcdonald
Affiliation:
Center for Integrated Electronics and Electronics Manufacturing, Rensselaer Polytechnic Institute, Troy, NY 12180
Shyam P. Murarka
Affiliation:
Center for Integrated Electronics and Electronics Manufacturing, Rensselaer Polytechnic Institute, Troy, NY 12180
Get access

Abstract

Low dielectric constant insulators offer the potential of improved interconnection delay and conductor packing density in advanced ICs, both with current metallization schemes and with future technologies such as copper. While polymer materials are very promising in such applications, significant issues must be addressed before oxide-based materials are replaced in mainstream applications. This invited paper reviews the directions of our program, which has emphasized the use of vapor deposited polymers compatible with uniform deposition over large diameter wafers and copper metallization. Therefore, emphasis is placed on polymer material characteristics compatible with inlaid metal (ie. Dual Damascene) patterning.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Gutmann, R.J., Chow, T.P., Gill, W.N., Kaloyeros, A.E., Lanford, W A. and Murarka, S. P, MRS Proceedings, Vol.337, Spring 1994, p. 41.Google Scholar
2. Murarka, S.P., Gutmann, R.J., Kaloyeros, A.E. and Lanford, W.A., Thin Solid Films 236, 1993, pp. 257.Google Scholar
3. Ding, P.J., Lanford, W.A., Hymes, S. and Murarka, S.P., Appl. Phys. Lett. 65, 1994, p. 1778.Google Scholar
4. Ding, P.J., Lanford, W.A., Hyrnes, S. and Murarka, S. P., Appl. Phys. Lett. 65, 1994, p. 1897.Google Scholar
5. Steigerwald, J., Zirpoli, R., Murarka, S.P., Price, D. and Gutmann, R.J., J. Electrochem. Soc., 141, 1994, p. 2842.Google Scholar
6. Lakshminarayanan, S., Steigerwald, J., Price, D.T., Bourgeois, M., Chow, T.P., Gutmann, R.J. and Murarka, S.P., IEEE Elec. Dev. Lett., 15, 1994, p. 307.Google Scholar
7. Ohmi, T., Saito, T., Otsuki, M., Shibata, T. and Nitta, T., J. Electrochem. Soc. 138, 1089 (1991).Google Scholar
8. Luther, B. et al, Proc. of 1993 VMIC Conference, VMIC Cat. No. 93, ISMIC-102 (Wade, T.E., Univ. of South Florida, Tampa, Florida, 1993), p. 15.Google Scholar
9. Murarka, S.P., Steigerwald, J. and Gutmann, R.J., MRS Bulletin, XVIII, 46 (1993).Google Scholar
10. Pourbaix, M., Atlas of Electrochemical Equilibria in Aqueous Solutions, NACE, Houston, TX (1975).Google Scholar
11. Steigerwald, J.M., Ph.D. thesis, Rensselaer Polytechnic Institute, 1995.Google Scholar
12. Mortimer, C.E., Chemistry, Wadsworth Co., Belmont, CA, 1983, pg. 371.Google Scholar
13. Steigerwald, J.M., Murarka, S.P., Gutmann, R.J. and Duquette, D.J., J. Electrochem. Soc., accepted for publication.Google Scholar
14. Majid, N., Dabral, S. and McDonald, J.F., J. Electronic Materials, 18, 1989, pg. 301.Google Scholar
15. Zhang, X., You, L., Dabral, S., Chiang, C., Yaney, D.S., Joshi, R.V., Yang, G.R., Lu, T.M. and McDonald, J.F., VLSI Multilevel Interconnects Digest, 1993, pg. 168.Google Scholar
16. Chow, S.W., Loeb, W.E. and White, C.E., J. Appl. Polym. Sci. 13, 1969, pg. 2325.Google Scholar
17. You, L., Yang, G.-R., Lu, T.-M., Moore, J.A., McDonald, F.P., US Patent 5268202 (1993).Google Scholar
18. Moore, J.A., Lang, C.-I., Lu, T.-M. and Yang, G.-R., Polymer Materials Science and Engineering, Vol.72, 1995, pg. 437.Google Scholar
19. Zhang, X., Chiang, C., McDonald, J.F. and Wang, B., DUMIC Conference, 1995, pg. 290.Google Scholar
20. Gutmann, R.J., Advanced Microelectronic Devices and Processing, Sendai, Japan, 1994, p. 335 Google Scholar