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Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

Published online by Cambridge University Press:  22 February 2011

M. Vrána ,
P. Klimanek ,
T. Kschidock ,
P. Lukáš  and
P. Mikula
M. Vrána
Affiliation:
Nuclear Physics Institute, 250 68 Řež, Czech Republic
P. Klimanek
Affiliation:
Freiberg University of Mining and Technology, D-09596 Freiberg, Germany
T. Kschidock
Affiliation:
Freiberg University of Mining and Technology, D-09596 Freiberg, Germany
P. Lukáš
Affiliation:
Nuclear Physics Institute, 250 68 Řež, Czech Republic
P. Mikula
Affiliation:
Nuclear Physics Institute, 250 68 Řež, Czech Republic
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Abstract

Investigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 376: Symposium BB – Neutron Scattering in Materials Science , 1994 , 409
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1 Klimanek, P., in X-Ray and Neutron Structure Analysis in Materials Research, edited by Hasek, J. (Plenum Press, New York, 1989), p. 125.Google Scholar
2 Klimanek, P., in Proc. EPDIC 1, Mat.Sci.Forum 79–82, Pt.1,73 (1991).Google Scholar
3 Klimanek, P., Kschidock, T., Mucklich, A., Mikula, P., Vrana, M., Lukas, P., in Proc. EPDIC 2, Mat.Sci.Forum 133–136, 391,(1993)Google Scholar
4 Klimanek, P., Kschidock, T., Lukas, P., Mikula, P., Mucklich, A., Vrana, M., J Physique IV, 3, 2143 (1993).Google Scholar
5 Baston, A.H. and Harris, D.H.C., AERE Report R-9278, (1978).Google Scholar
6 Hewat, A.W. and Bailey, I., Nucl. Instr. Meth. 137, 463, (1976)Google Scholar
7 Allen, A. J., Andreani, C. and Hutchings, M. T., NDT International, p. 249, (1981).Google Scholar
8 Kocsis, M., Kulda, J., NATO Advanced Research Workshop, Oxford, 1991.Google Scholar
9 Lukas, P., Vrána, M., Mikula, P. and Kulda, J., in Proc. of SPIE’s 1992 International Symp. on Optical Applied Science and Engineering, San Diego, 22–24 July 1992, 1738 pp. 438-443.Google Scholar
10 Vrâna, M., Lukâs, P., Mikula, P., Kulda, J., Nucl. Instr. and Meth. A 338, 125 (1994).Google Scholar
11 Klug, H.P., Alexander, L.E., X-Ray Diffraction Procedures, J.Wiley & Sons, New York, 1974.Google Scholar
12 Delhez, R., De Keijser, Th.H., Mittemeijer, E.J., Fresenius Z. Anal. Chem. 312, 1 (1982).Google Scholar