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Including Nanoscale Investigations in Undergraduate Physics Laboratories at all Levels of the Curriculum

Published online by Cambridge University Press:  01 February 2011

Kurt Vandervoort ,
Asif Hyder ,
Stephanie Barker  and
Raul Torrico
Kurt Vandervoort
Affiliation:
[email protected], California State Polytechnic University, Physics, 3801 W. Temple Ave., Pomona, CA, 91768, United States
Asif Hyder
Affiliation:
[email protected], California State Polytechnic University, Physics Dept., Pomona, CA, 91768, United States
Stephanie Barker
Affiliation:
[email protected], California State Polytechnic University, Physics Dept., Pomona, CA, 91768, United States
Raul Torrico
Affiliation:
[email protected], California State Polytechnic University, Physics Dept., Pomona, CA, 91768, United States
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Abstract

A series of laboratory modules were developed to introduce atomic force microscope (AFM) applications into undergraduate physics courses. The goal is to elucidate fundamental physics concepts at the nanoscale that will complement existing investigations at the macroscale, and to expose students to advanced instrumentation at an early level. The experiments allow students to experience the full range of scanning probe modes available, which include contact, intermittent contact, lateral force, and magnetic force microscopy as well as force distance spectroscopy. The course levels span the range from freshman introductory to advanced senior level and allow students to experience AFM applications at successive levels of complexity.

Keywords

nanoscalescanning probe microscopy (SPM)nanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 931: Symposium KK – Education in Nanoscience and Engineering , 2006 , 0931-KK03-02
Copyright
Copyright © Materials Research Society 2006

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