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Emission Light Properties from Ag/Rhodamine-B LB Films Due to Surface Plasmon Excitations in the Kretschmann and Reverse Configurations

Published online by Cambridge University Press:  21 March 2011

T. Nakano
Affiliation:
Niigata University, Graduate School of Science and Technology, Niigata, JAPAN
H. Kobayashi
Affiliation:
Niigata University, Graduate School of Science and Technology, Niigata, JAPAN
K. Shinbo
Affiliation:
Niigata University, Dept. of Electrical and Electronic Engineering, Niigata, JAPAN
K. Kato
Affiliation:
Niigata University, Graduate School of Science and Technology, Niigata, JAPAN
F. Kaneko
Affiliation:
Niigata University, Dept. of Electrical and Electronic Engineering, Niigata, JAPAN
T. Kawakami
Affiliation:
Niigata University, Dept. of Electrical and Electronic Engineering, Niigata, JAPAN
T. Wakamatsu
Affiliation:
Dept. of Electrical Engineering, Ibaraki National College of Technology, Hitachinaka, JAPAN
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Abstract

Emission light from Ag/ Rhodamine-B (RB) Langmuir-Blodgett (LB) films due to surface plasmon (SP) excitations has been investigated using the Kretschmann configuration of the attenuated total reflection (ATR) method and the reverse irradiation of laser beam from air to the samples. The conventional photoluminescence (PL) of the RB LB films showed a broad spectrum and the peak wavelength was about 600 nm. In the reverse irradiation, emission light was observed through the prism, and the intensities and the spectra strongly depended upon the emission angle where the light was observed. The wavelengths of the emission light became shorter as the emission angles increased. The relation between the wavelength and the emission angle agreed with the resonant condition of excitations of SPs in the Kretschmann configuration of ATR method. It was concluded that the emission light was caused by excitations of multiple SPs at the Ag/RB LB films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

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