Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-06T12:14:55.628Z Has data issue: false hasContentIssue false
  • English
  • Français

Elastic Property Estimation in Polycrystalline Films with Crystallographic Texture and Grain Shape

Published online by Cambridge University Press:  15 February 2011

B. C. Hendrix ,
L. G. Yu ,
K. W. Xu  and
J. W. He
B. C. Hendrix
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, 710049 CHINA, [email protected]
L. G. Yu
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, 710049 CHINA, [email protected]
K. W. Xu
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, 710049 CHINA, [email protected]
J. W. He
Affiliation:
State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, 710049 CHINA, [email protected]
Get access

Abstract

Although methods of measuring the elastic properties of thin films have made great advances with the use of bulge testing of membranes, deflection of micromachined beams, and nanoindentation, most results are still being compared to either isotropic or single crystal elastic constants, neither of which are, in general, appropriate for textured polycrystalline films. This paper uses recent results of a self-consistent model (after Krbner and Kneer) which calculates the elastic anisotropy arising from crystallographic texture and which has been extended to predict the anisotropy resulting from grain shape. These results are compared to the various Voigt, Reuss, and Hill approximations that are appropriate for different crystallographic textures. The accuracies of the different models are evaluated in terms of their ability to predict the biaxial modulus and indentation compliance that are most commonly measured in thin films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 403: Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II , 1995 , 171
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hendrix, B.C. and Yu, L.G., manuscript in preparation.Google Scholar
2. Kröner, E., Z. Phys. 151, 504 (1958).Google Scholar
3. Eshelby, J.D., Proc. Roy. Soc. Lon. A 241, 376 (1957).Google Scholar
4. Kneer, G., Phys. Stat. Sol. 9, 825 (1965).Google Scholar
5. Morris, P.R., Int. J. Engnng. Sci. 8, 49 (1970).Google Scholar
6. Turner, J.R., Int. J. Solids Struct. 16, 409 (1980).Google Scholar
7. Bunge, H. J., Mathematische Methoden der Texturanalyse, (Akademie Verlar: Berlin, 1969), (in German, English translation available).Google Scholar
8. Huntington, H.B., in Solid State Physics, Advances and Research Applications, vol. 7, edited by Seitz, F. and Turnbull, D. (Academic Press: New York, 1958) pp. 213–351.Google Scholar
9. Perry, A.J., Thin Solid Films 193/194, 463 (1990).Google Scholar
10. Yu, L.G., Master's Thesis, Xi'an Jiaotong University, 1992.Google Scholar