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Effect of Dislocation Sources on Slip in Fe2Nb Laves Phase with Ni in Solution

Published online by Cambridge University Press:  29 November 2012

N. Takata
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan
H. Ghassemi-Armaki
Affiliation:
School of Engineering, Brown University, Providence, RI 02912, U.S.A.
Y. Terada
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan
M. Takeyama
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan
S. Kumar
Affiliation:
School of Engineering, Brown University, Providence, RI 02912, U.S.A.
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Abstract

We have examined the compression response of a ternary Fe2Nb Laves phase by deforming micropillars with a diameter of ~2 μm produced by focused ion beam milling from a two-phase Fe-15Nb-40Ni (at.%) ternary alloy consisting of the Laves phase and γ-Fe. The Laves phase micropillars exhibit high strength of about 6 GPa (of the order of the theoretical shear strength of the material), followed by a burst of plastic strain and shear failure on the basal plane. If dislocation sources are introduced on a non-basal plane in the micropillars by nanoindentation prior to compression, yielding occurs at a significantly lower stress level of about 3 GPa and plastic deformation by slip proceeds on a pyramidal plane close to (-1-122). Furthermore, if regenerative dislocation sources for basal slip are present in the micropillar, the Laves phase can be continuously plastically deformed in a stable manner to at least 5% strain at a significantly lower stress of 800 MPa. We thus demonstrate the plastic deformation of this ternary Laves phase at the micron-scale at room temperature when sufficient dislocation sources are present.

Type
Articles
Copyright
Copyright © Materials Research Society 2012 

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References

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