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Domain Structure of Poled Ferroelectric (111) PZT (PbZr0.25Ti0.75O3) Films

Published online by Cambridge University Press:  10 February 2011

C.E. Zybill ,
H. Boubekeur ,
P. Radojkovic ,
M. Schwartzkopff ,
E. Hartmann ,
F. Koch ,
G. Groos ,
B. Rezek ,
R. Bruchhaus  and
W. Wersing
C.E. Zybill
Affiliation:
Physik Department E16, Technische Universität Minchen, James Franck Str. 1, 85747 Garching, Germany, [email protected]
H. Boubekeur
Affiliation:
Physik Department E16, Technische Universitat Minchen, James Franck Str. 1, 85747 Garching, Germany
P. Radojkovic
Affiliation:
Physik Department E16, Technische Universitat Minchen, James Franck Str. 1, 85747 Garching, Germany
M. Schwartzkopff
Affiliation:
Physik Department E16, Technische Universitat Minchen, James Franck Str. 1, 85747 Garching, Germany
E. Hartmann
Affiliation:
Physik Department E16, Technische Universitat Minchen, James Franck Str. 1, 85747 Garching, Germany
F. Koch
Affiliation:
Physik Department E16, Technische Universitat Minchen, James Franck Str. 1, 85747 Garching, Germany
G. Groos
Affiliation:
Walter Schottky Institut, Am Coulombwall 1, 85747 Garching
B. Rezek
Affiliation:
Walter Schottky Institut, Am Coulombwall 1, 85747 Garching
R. Bruchhaus
Affiliation:
Siemens AG, ZT MF2, Otto-Hahn-Ring 6, 81739 München
W. Wersing
Affiliation:
Siemens AG, ZT MF2, Otto-Hahn-Ring 6, 81739 München
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Abstract

Films of (111) oriented self-polarized, tetragonal ferroelectric PZT crystallites on (100)Si/SiO2(250 nm)/(111) Pt (50 nm) have been investigated by STM, AFM and SAXS. After metallization of the PZT surface with a Cr-Ni film (5.2 nm thickness) or a Ti film (5.0 nm thickness), single domains were visible on the metal surface by STM measurements as parallel stripes. The lamellar stripes had a width of 10.5 – 25.2 nm and a vertical corrugation of 0.9 – 3.0 nm at the intersection line of the domain walls with the crystallite surface.

High resolution AFM with EBD supertips on unmetallized samples revealed areas of typically several µm in diameter showing crystallites with perfectly parallel aligned (90°) domains of 10 - 15 nm width with their boundaries along {110} planes. Single domain walls were visible as a trace on the surface by a negative corrugation effect of 1.0 – 1.5 nm. This corrugation is assumed to be a reflection of the strain distribution normal to the surface. Furthermore, coherency (oxygen) defects are accumulated at the interface between 90 ° twin domains.

SAXS investigations allowed to estimate a mean value of domain thickness of 17.5 nm. Exertion of stress (5.1 104Nm−2) to the film resulted in an increase of domain width by ∼1%.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 541: Symposium O – Ferroelectric Thin Films VII , 1998 , 449
Copyright
Copyright © Materials Research Society 1999

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