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Determining In-plane and Thru-plane Percolation Thresholds for Carbon Nanotube Thin Films Deposited on Paper Substrates Using Impedance Spectroscopy

Published online by Cambridge University Press:  02 September 2013

Rachel L. Muhlbauer
Affiliation:
Georgia Institute of Technology, 771 Ferst Dr. Atlanta, GA 30332, USA
Rosario A. Gerhardt
Affiliation:
Georgia Institute of Technology, 771 Ferst Dr. Atlanta, GA 30332, USA
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Abstract

Concentration- and layer-dependent percolation thresholds can be determined for carbon nanotube (CNT) films deposited from aqueous dispersions on paper substrates at both the surface of the deposited film (in-plane) and through the thickness of the paper (thru-plane) using impedance spectroscopy. By analyzing the impedance spectra as a function of the number of layers (solution concentration is constant) or the solution concentration (number of layers is constant), the electrical properties and percolation thresholds for CNT-paper composites can be determined. In-plane measurements show that percolation occurs at 4 layers when 1 mg/mL solution concentration is used. In the thru-plane direction, the films are already percolated at 1 mg/mL concentration, which is confirmed by varying the concentration of the solution used to deposit 1 layer films. A second percolation event happens between 8 and 12 layers due to an increased number of interconnections of CNTs within the paper substrate. The lowest sheet resistance achieved was 100 Ω/□.

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

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References

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