Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T09:46:10.262Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterizing Trace Metal Impurities in Optical Waveguide Materials Using X-Ray Absorption

Published online by Cambridge University Press:  10 February 2011

P. H. Citrin ,
P. A. Northrup ,
R. M. Atkins ,
P. F. Glodis ,
L. Niu ,
M. A. Marcus  and
D. C. Jacobson
P. H. Citrin
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
P. A. Northrup
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
R. M. Atkins
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
P. F. Glodis
Affiliation:
Bell Laboratories, Lucent Technologies, Norcross, GA 30071
L. Niu
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
M. A. Marcus
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
D. C. Jacobson
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
Get access

Abstract

X-ray absorption measurements are described for identifying metal impurities insilica preforms, the rod-like starting materials from which hair-like optical fibers are drawn.The results demonstrate the effectiveness of this approach as a non-destructive,quantitative, element-selective, position-sensitive, and chemical-state-specific means forcharacterizing transition metals in the concentration regime of parts per billion.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 251
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Optical Fiber Telecommunications, edited by Miller, S. E. and Chynoweth, A. G. (Academic Press, Inc., New York, 1979), p. 705.Google Scholar
[2] Optical Fiber Communications 1, edited by Li, T. (Academic Press, Inc., New York, 1985), p. 363.Google Scholar
[3] Nagel, S. R., IEEE Circ. Dev. Mag., March 1989, p. 36.Google Scholar
[4] Csenscits, R., Lemaire, P. J. Reed, W. A., Shenk, D. S., and Walker, K. L., Tech. Dig., Opt. Comm. Conf., Feb. 1984.Google Scholar
[5] Nagel, S. R., MacChesney, J. B., and Walker, K. L., IEEE J. Quantum Electron. 18, 459 (1982).Google Scholar
[6] MacDowell, A. A., Hashizume, T., and Citrin, P. H., Rev. Sci. Instrum. 60, 1901 (1989).Google Scholar
[7] Gerward, L., Nucl. Instrum. Methods 181, 11 (1981).Google Scholar
[8] Lee, P. A., Citrin, P. H., Eisenberger, P., and Kincaid, B. M., Rev. Mod. Phys. 53, 769 (1981).Google Scholar
[9] For example, see Schuppler, S., Adler, D. L., Pfeiffer, L. N., West, K. W., Chaban, E. E., and Citrin, P. H., Phys. Rev. B 51, 10527 (1995).Google Scholar