Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-25T17:48:19.428Z Has data issue: false hasContentIssue false

Challenges in DMD™ Assembly and Test

Published online by Cambridge University Press:  17 March 2011

S. Joshua Jacobs
Affiliation:
Dennis Doane Digital Imaging Texas Instruments 13536 N. Central Expressway MS 914 Dallas, TX 75243
Joshua J. Malone
Affiliation:
Dennis Doane Digital Imaging Texas Instruments 13536 N. Central Expressway MS 914 Dallas, TX 75243
Seth A. Miller
Affiliation:
Dennis Doane Digital Imaging Texas Instruments 13536 N. Central Expressway MS 914 Dallas, TX 75243
Armando Gonzalez
Affiliation:
Dennis Doane Digital Imaging Texas Instruments 13536 N. Central Expressway MS 914 Dallas, TX 75243
Roger Robbins
Affiliation:
Dennis Doane Digital Imaging Texas Instruments 13536 N. Central Expressway MS 914 Dallas, TX 75243
Vincent C. Lopes
Affiliation:
Dennis Doane Digital Imaging Texas Instruments 13536 N. Central Expressway MS 914 Dallas, TX 75243
Get access

Abstract

The Digital Micromirror Device™ (DMD™) developed at Texas Instruments is a spatial light modulator composed of 500,000 to 1.3 million movable micromachined aluminum mirrors. The DMD™ serves as the engine for the current generation of computer-driven slide and video projectors, and for next generation devices in digital television and movie projectors. The unique architecture and applications of the device present several packaging and test challenges. This paper provides a description of package humidity modeling and verification testing, as well as an overview of the automated optical testing and test equipment that have been developed to support manufacturing of the DMD™.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Worldwide Display Group 6/00Google Scholar
[2] Shook, R., Conrad, T, Sastry, V., Steele, D., “Diffusion Model To Derate Moisture Sensitive Surface Mount ICs For Factory Use Conditions”, Proceedings of the 1995 Electronic Components and Technology Conference, May 21-24, pp. 440449, 1995.Google Scholar
[3] Boyce, W., DiPrima, R., “Elementary Differential Equations and Boundary Value Problems”, John Wiley & Sons, 3rd Edition, New York, Chapter 10, pp. 452518, 1997.Google Scholar
[4] Vieth, W., “Diffusion in and Through Polymers”, Hanser Publishing, New York, Chapter 4, pp. 7382, 1991.Google Scholar
[5] American Society for Testing and Materials, “Standard Test Method for Water Vapor Transmission Rate Through Plastic Film and Sheeting Using a Modulated Infrared Sensor”, Standard ASTM F-1249- 90(1995), 1995.Google Scholar
[6] Pasternak, R., Schimscheimer, J., Heller, J., “A Dynamic Approach to Diffusion and Permeation Measurements”, Journal of Polymer Science, Vol. 8, Part A-2, pp. 467479, 1970.Google Scholar
[7] Gavara, R., Hernandez, R., “Consistency Test for Continuous Flow Permeability Experimental Data”, Journal of Plastic Film & Sheeting, Vol. 9, pp. 126138, April, 1993.Google Scholar
[8] Darwin, D., Grace-Davison Corporation, private communication.Google Scholar
[9] Mezenner, Rabah et al. ; “A DMD Characterization Test Matrix”, Texas Instruments internal document.Google Scholar
[10] The MirrorMaster is covered by US Patent No. 6088474.Google Scholar