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Use of a New Imaging Technique to Document Deformations Recorded in the Environmental Scanning Electron Microscope

Published online by Cambridge University Press:  14 March 2018

Edward F. O'Neil ,
Hamlin M. Jennings  and
Jeffrey J. Thomas
Edward F. O'Neil*
Affiliation:
US Army Corps of Engineers
Hamlin M. Jennings
Affiliation:
Northwestern University
Jeffrey J. Thomas
Affiliation:
Northwestern University
*
Ed.F.O'[email protected]

Extract

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The introduction of the environmental scanning electron microscope (ESEM) greatly Improved the functionality of scanning electron microscope (SEM) technology by allowing objects to be imaged in water-vapor under low vacuum, and without the need for coating to facilitate electrical conductivity. The low vacuum environment allows Imaging of delicate structures, such as needlelike crystals, without fear of damaging the object in the process of viewing it.

Type
Research Article
Information
Microscopy Today , Volume 11 , Issue 3 , June 2003 , pp. 36 - 38
Copyright
Copyright © Microscopy Society of America 2003

References

1. Xi, Y., Bergstrom, T. B., and Jennings, H. M., “Image intensity matching technique: application to the environmental scanning electron microscope,“ Computational Materials Science, vol. 2, 1994, pp 249–260.Google Scholar
2. Chen., J.J., Rothstein, D., Thomas, J J., & Jennings, H.M. “Application of the Deformation Mapping Technique to Assess Deterioration in Cement-Based Materials,” Transportation Research Record, Journal of The Transportation Research Board, No. 1775, Concrete 2001, 28-35 (2001),Google Scholar
3. Neubauer, C. M., and Jennings, H. M., “The Use of Digital Images to Determine Deformation Throughout a Microstructure, Part II: Application to Cement Throughout a Microstructure,” Journal of Materials Science, vol 35, 5751–5765 (2000).Google Scholar