The Small Angle Cleavage Technique (SACT) developed by John McCaffrey is an extremely easy and cost-effective technique for producing superior cross sectional TEM samples from semiconductor and other single crystal materials. In the original technique, a special jig is required to be made in order to make too cuts in a 2 x 0.5 mm slotted capper TEM grid to create vertical tabs to mount the cleaved samples. This jig is not commercially available and the actual cutting and bending of the grids require a significant amount of manual dexterity. (Fat fingered fellows, like myself, need not apply.) Early on, John proposed a design for a commercial grid that could easily be bent into the required shape with no cutting, but the electron microscopy supply houses passed on the idea. Until now, microscopists wanting to experiment with the technique had to invest in the cost of having one of these jigs made.