Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-24T00:01:25.552Z Has data issue: false hasContentIssue false
  • English
  • Français

A Review Of The Development Of Scanning Electron Microscopy At High Chamber Pressure

Published online by Cambridge University Press:  14 March 2018

Vivian Robinson
Vivian Robinson*
Affiliation:
ETP Semra Pty. Ltd. 244 Canterbury Road, Canterbury, NSW, 2193, Australia

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Ever since electron microscopes were developed, it has been the goal of microscopists to observe specimens in their natural state, free from artefacts which can often be introduced through specimen preparation. For most biological specimens, that includes the presence of water. With a pressure of 10-4 torr or lower required to operate a scanning electron microscope (SEM), liquid water, which required a pressure of above 5 torr, was clearly a problem.

Although several attempts had been made to examine hydrated specimens in a SEM, the first published results of water imaged in a stable and reproducible manner in the SEM, were presented at the Eighth International Congress on Electron Microscopy in Canberra in 1974 (Robinson, 1974).

Type
Research Article
Information
Microscopy Today , Volume 5 , Issue 1 , January 1997 , pp. 14 - 15
Copyright
Copyright © Microscopy Society of America 1997

References

List of References

Robinson, V N E: A wet stage modification to a scanning electron microscope; Electron Microscopy/1974, Proc. 8th Int. Cong., Ed. J V Sanders and D J Goodchild, Aust. Acad. Sci., Canberra , Vol. 2 (1974a) pp 50– 51.Google Scholar
Dushman, S: Scientific foundations of vacuum technique; John Wiley and Sons, NewYork, Ch.2(1949).Google Scholar
Robinson, V N E: The construction and uses of an efficient backscattered electron detector for scanning electron microscopy; J, Phys, E: Sci. Instrum ., Vol. 7, pp 650– 652 (1974b).Google Scholar
Robinson, V N E: Backscattered electron imaging; Scanning Electron Micrscopy/ 1975, Symp. Proc, Ed. o Johari, IITRI, Chicago, (1975a) pp 51–60.Google Scholar
Robinson, V N E: A wet stage modification to a scanning electron microscope; J. Microscopy, Vol. 103, pp 71 - 77 (1975b).Google Scholar
Robinson, V N E: Scanning electron microscope environmental cells; Scanning Electron Micrscopy/1976, Vol. 1, Symp. Proc, Ed. O Johari, and Corvin, I, IITRI, Chicago (1976a) pp 91–100.Google Scholar
Robinson, V N E: The examination of hydrated biological specimens in a scanning electron microscope environmental cell; Electron Microscopy/1976, Proc 6th Europ. Cong., Ed. YBen-Shaul,Tal International, Jerusalem, Vol 2 (1976b) pp 85 -90.Google Scholar
Robinson, V N E: The elimination of charging artefacts in the scanning electron microscope; J. Phys. E: Sci. Instrum ., Vol. 8, pp 638– 644 (1975c).Google Scholar
Moncrieff, D A, Robinson, V N E, Harris, L B, Neutralisation of insulating surfaces in the scanning electron microscope, J. Phys. D: Appl. Phys . Vol. 12, pp 2315– 2325(1978).Google Scholar
Moncrieff, D A, Barker, P R, Robinson V N E: Electron scattering by gas in the scanning electron microscope; J. Phys. D: Appl. Phys ., Vol. 12, pp 481– 487 (1979).Google Scholar
Danilatos, G D, Robinson V M E: Principles of scanning electron microscopy at high specimen chamber pressures ; Scanning Vol. 2, pp 72– 82 (1979).Google Scholar
Neal, R J, Mills, A Jr: Dynamic hydration studies in an SEM; Scanning , Vol. 3, pp 292–300(1980).Google Scholar
Shah, J S, Beckett, A: A preliminary evaluation of moist environment ambient temperature scanning electron microscopy (MEATSEM) ; Micron, Vol. 10, pp 13– 23(1979).Google Scholar
Danilatos, GD : Design and construction of an atmospheric or environmental SEM (Part 1), Scanning Vol. 4,9 - 20 (1981).Google Scholar
Danilatos, G D: A gaseous detector device for an environmental SEM; Micron and Microscopies Ada , Vol. 14, pp 41–52 (1983)Google Scholar
Robinson, V N E: The examination of hydrated specimens in electron microscopes; in Echlin P, Analysis of organic and biological surfaces, John Wiley and Sons, New York.Google Scholar