Polymer films and fibers can readily be imaged in a “top-view“ mode by depositing the sample directly on a transmission electron microscopy (TEM) support grid. Sample preparation of thin polymer films and fibers for cross-sectional views in the electron microscope, however, is a major challenge. Owing to their small dimensions, the films or fibers cannot be mounted alone, because they will not remain immobilized In the microtome, even at low temperatures. Brittle polymers complicate sample preparation even further because they tend to break due to the mechanical stresses exerted on them by the microtome sample holder and the knife. Such sections often jump off the knife-edge or the sample film, thus preventing a systematic collection of thin sections. Similar arguments apply for cross-sectional atomic force microscopy (AFM).