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Putting a Sphere on an Atomic Force Microscope Cantilever Tip

Published online by Cambridge University Press:  14 March 2018

Stefan Zauscher
Stefan Zauscher*
Affiliation:
University of Wisconsin Madison

Extract

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Atomic Force Microscopes (AFM) can measure the force between a surface and the tip of a cantilever as a junction of separation with great precision. For example, van der Waals type forces and electrostatic repulsive forces can easily be measured in aqueous solutions using an AFM. The complex, pyramidal shape of the typical AFM cantilever is, however, not well suited for quantitative measurements. It is thus desirable to attach particles of known geometry (usually spheres) to the tip of a cantilever.

Type
Research Article
Information
Microscopy Today , Volume 5 , Issue 10 , December 1997 , pp. 6
Copyright
Copyright © Microscopy Society of America 1997

References

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