Hostname: page-component-7bb8b95d7b-wpx69 Total loading time: 0 Render date: 2024-09-12T10:07:41.626Z Has data issue: false hasContentIssue false

Pushing the Envelope in Atomic Force Microscopy

Published online by Cambridge University Press:  14 March 2018

Monteith G. Heaton*
Affiliation:
Asylum Research, Santa Barbara, CA
Jason P. Cleveland
Affiliation:
Asylum Research, Santa Barbara, CA

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. However, aside from some interesting tweaks, add-ons and repackaging, the field has seen no fundamentally new instruments for several years. For the extremely high-resolution AFM/SPMs, there has literally been no completely new microscope for well over a decade. We report here on the new CypherTM AFM from Asylum Research (Figure 1). that delivers upgrades from the existing field of older AFM/SPMs on a variety of levels.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2009