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Progress Towards More Realistic In-Situ Microscopy Observations

Published online by Cambridge University Press:  14 March 2018

A. Howie
A. Howie*
Affiliation:
Cavendish Laboratory, University of Cambridge, UK

Extract

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As progress indicators in electron microscopy, advances in spatial resolution and in spectroscopy probably attract most frequent attention. Improved user-friendliness has also been significant even when judged in comparison with scanned probe microscopy. Evidence for developments in in-situ microscopy at least equally impressive can be found by comparing the relevant sections of the book by Hirsch et al. and a more recent compilation.

Peter Hirsch's research group swiftly discovered the power and frustrations of in-situ microscopy. The cine film of dislocation motion observed in the earliest diffraction contrast studies, and attributed to the thermal stresses generated by the electron beam, was extremely effective in convincing the wider community that it was indeed dislocations that were being observed.

Type
Research Article
Information
Microscopy Today , Volume 10 , Issue 4 , July 2002 , pp. 5 - 7
Copyright
Copyright © Microscopy Society of America 2002

References

[1] Hirsch, P.B. et al., Electron Microscopy of Thin Crystals, Butterworth, London, 1965.Google Scholar
[2] Gai, P.L. (ed), In-situ Microscopy in Materials Research, Kluwer, Boston, 1997.CrossRefGoogle Scholar
[3] Hirsch, P.B. et al., Phil. Mag. 1 (1956) 677.Google Scholar
[4] Whelan, M.J. et al., Proc. Hoy. Soc. A240 (1957) 524.Google Scholar
[5] Silcox, J. and Whelan, M.J., Phil. Mag. 5 (1960) 1.Google Scholar
[6] Thomas, G. and Whelan, M.J.. Phil. Mag. 6 (1961) 1103.CrossRefGoogle Scholar
[7] Bailey, J.E., Phil. Mag. 5 (1960) 833.Google Scholar
[8] Pashley, D.W. et al., Phil. Mag. 10 (1964) 127.CrossRefGoogle Scholar
[9] Valdre, U. et al., J. Phys. E 3 (1970) 501.Google Scholar
[10] Goulden, D.A., Phil. Mag. 33 (1976) 393.Google Scholar
[11] Yang, J.C. et al., Microscopy Microanal. 7 (2001) 486.Google Scholar
[12] Yagi, K., Surf. Sci. Rep. 17 (1993) 305.Google Scholar
[13] Bauer, E., J. Electron Spectrosc. & Rel. Phenom. 114 (2001) 975.Google Scholar
[14] Williams, E.D. and Marks, L.D., Crit. Rev. in Surf. Chem. 5 (1995) 275.Google Scholar
[15] Baker, R.T.K. and Waite, R.J., J. Catal. 37 (1975) 101.Google Scholar
[16] Gai, P.L. and Goringe, M.J., Proc 39th EMSA Conf., San Francisco Press, 1981, 68.Google Scholar
[17] Boyes, E.D. and Gal, P.L., Ultramicrosc. 67 (1997) 219.CrossRefGoogle Scholar
[18] Gal, P.L., Advanced Mater. 10 (1998) 1259.Google Scholar
[19] Gal, P.L., Topics In Catalysis 8 (1999) 97.Google Scholar
[20] Hansen, T.W. et al., Science 294 (2001) 1508.Google Scholar
[21] Oleshko, V.P., Crozier, P., Cantrell, R.D. and Westwood, A.D., J. Electr. Microsc. 51 (2002) S27.Google Scholar
[22] Weeks, B.L. et al., Rev. Sci. Instrum. 71 (2000) 3777.Google Scholar
[23] Osterland, L. et al., Phys. Rev. Lett. 86 (2001) 460.CrossRefGoogle Scholar
[24] Over, H. et al., Science 287 (2000) 1474.Google Scholar
[25] Dellwig, T. et al., Phys. Rev. Lett. 85 (2000) 776.CrossRefGoogle Scholar
[26] This article is slightly expanded from one prepared for the Quebec MSA meeting's in-situ microscopy symposium honoring Sir Peter Hirsch. I am very grateful to Dr P.L. Gal, one of the organizers, for much helpful advice and for making available the figures used here.Google Scholar