Frequently, the need arises for the measurement of the beam current in an electron microscope. For good quantitative analysis with either energy dispersive or wavelength dispersive spectrometers, the beam current is essential. The value of the beam current is used in quantitative microanalysis programs to equilibrate the production of X-ray generation between an unknown sample and a known calibration sample, i.e., a standard. Measurement of the beam current over time can also be quite helpful in determining problems with instrument stability. The following is a description of two very inexpensive methods for making a Faraday cup for measuring beam current in an SEM. It assumes that the microscope has a specimen current meter.