Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-09T05:28:50.496Z Has data issue: false hasContentIssue false

New Capabilities for the TEM: Automatic Orientation Measurement and Nanocrystal Grain Maps

Published online by Cambridge University Press:  14 March 2018

S.I. Wright
Affiliation:
TSL, Inc. 392 East 12300 South, Draper, Utah 84020
D.J. Dingley
Affiliation:
TSL, Inc. 392 East 12300 South, Draper, Utah 84020
P.R. Mainwaring
Affiliation:
TSL, Inc. 392 East 12300 South, Draper, Utah 84020

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Orientation Imaging Microscopy (OIM) is a rapid and spatially specific technique for automatically measuring individual crystallographic orientations in a polycrystalline sample. The technique is based on electron backscatter diffraction in the scanning electron microscope (SEM). While the OIM technique has seen many applications to the investigation of structure/ property relationships in polycrystalline materials, with grain sizes ranging from millimeters to submicron, it is not easily applied to the characterization of microstructures at the nanometer scale due to the inherent resolution limitations of the SEM. Thus, a complementary technique for the transmission electron microscope (TEM) would be advantageous for the study of local orientation in submicron structures such as those that exist in nanocrystalline materials and deformed materials.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 1999

References

[1] Adams, B. L., Wright, S. I., and Kunze, K., Met. Trans., 24A, (1993) p. 819,Google Scholar
[2] Wright, S. I., J. Computer Assisted Microscopy, 5, (1993) p. 207.Google Scholar
[3] Isabell, T. C. and Dravid, V. P., Ultramicroscopy, (1997) in pressGoogle Scholar
[4] Loretto, M. H., Electron Beam Analysis of Materials, 2 ed, (Chapman & Hall, London, 1994).Google Scholar